SANKO SWT-7000Ⅳseries+SFN-325 Thickness Meter

SANKO

SWT-7000Ⅳseries+SFN-325

Thickness Meter

Optional SWT probes are interchangeable.

◆ Dual type : SFN-325※　
◆ For ferrous : SFe type
◆ For non-ferrous : SNFe type

※The new SFN-325 can not be used with SWT-7000, SWT-7000Ⅱ,SWT-7000Ⅲ series but with SWT-7000Ⅳsereis only

Probe type

Dual SFN-325 (exclusive for SWT-7000Ⅳ series)

Measuring method

Electromagnetic/Eddy current dual use

Measuring range

Ferrous：0～3.00mm
Nonferrous：0～2.50mm

Substrate detection 

Automatic or manual switching

Display resolutions

1μm：0～999μm 
By switching,　
0.1μm：0～400μm,　
0.5μm：400～500μm,
0.01mm：（ferrous 1.00～3.00mm) ,（nonferrous 1.00～2.50mm）

Accuracy (place the probe perpendicularly

Ferrous ＆nonferrous dual use
0～100μm：±1μｍ　or ±2％ the read value（ferrous）
101μm～3.00mm：±2％（nonferrous）
101μm～2.50mm：±2％

Probe

One point contact constant pressure type,
with V cut φ13×51mm, 72g

Option

V type probe adaptors (3 types: less Φ5, Φ5～10, Φ10～20 )

Accessories

Calibration standards (plastic foils)
Zero plate （ferrous, nonferrous dual）

Measuring objectives

Fe substrate: coating, lining, thermal spraying, plating on magneticmetal like iron, steel (except electrolyte nickel plating)
NFe substrate: insulated films on non-magnetic metal like aluminum, copper