Mountable probes

1172 series

Number of test steps

Max. 900,000 steps

Measurement parameters and measurement ranges

Resistance : 

40.00 μΩ to 100.0 MΩ

Capacitance : 

10.00 fF to 40.00 mF

Inductance : 

10.00 μH to 100.0 mH

Diode VZ measurement : 

0.000 V to 25.00 V

Insulation resistance : 

200.0 Ω to 100.0 GΩ

Capacitance Insulation resistance : 

200.0 Ω to 10.00 MΩ

High voltage resistance : 

200.0 Ω to 25.00 GΩ

High voltage short resistance : 

400.0 mΩ to 400.0 kΩ

Leak current measurement : 

100.0 nA to 10.00 mA

Zener diode VZ measurement : 

0.000 V to 25.00 V

Digital transistor measurement : 

0.000 V to 25.00 V

Photo couplers measurement : 

0.000 V to 25.00 V

Continuity test : 

400 mΩ to 1.000 kΩ 

Open test : 

4.000 Ω to 4.000 MΩ

Short test : 

400.0 mΩ to 40.00 kΩ

DC voltage measurement : 

40.00 mV to 25.00 V

Judgment range

-99.9% to +999.9% or absolute value

Minimum pad pitch

35um (with CP1075-09)(when using FA1971-01)
40um (with CP1075-09)

Minimum pad size

5um (with CP1075-09)(when using FA1971-01)
10um (with CP1075-09)

Measurement speed

Max. 100 points/ s (X-Y movements of 0.1 mm, 4-arm simultaneous probing, when capacitance measurement)

Testable board size

Thickness : 0.1 mm to 2.5 mm (0.10 in)
Outer dimensions : 50 mm (1.97 in) W × 50 mm (1.97 in) D to 400 mm (15.75 in) W × 330 mm (12.99 in) D

Maximum testable area

400 mm (15.75 in) W × 324 mm (12.76 in) D

Board clamping

Board 2-side chuck method (with tension function)

Power supply

200 V, 220 V, 230 V, 240 V AC single-phase (specify at time of order), 50/60 Hz, 5 kVA

Dimensions and mass

1360 mm (53.54 in) W × 1200 mm (47.24 in) H × 1280 mm (50.39 in) D, (Excluding protruding parts), 1,100 kg (38,800.7 oz)